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A 120 kV Transmission Electron Microscope Series for Both Life Science and Material Science Fields
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1156-1157
- Print publication:
- August 2018
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Development of Multiple New 120 kV Transmission Electron Microscope Configurations Applicable for a Wide Range of Fields
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 62-63
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- July 2017
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In-situ SEM/TEM observation of platinum catalysts on carbon support in a gaseous atmosphere using a 300 kV CFE TEM/SEM
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 464-465
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- August 2013
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Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 114-115
- Print publication:
- July 2009
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